Semiconductor DC burn-in device for testing
This is a device that allows for reliability testing by setting arbitrary test conditions for prototype evaluation, mass production, etc.!
The "Semiconductor DC Burn-in Test Device" is a power supply testing device for high-frequency devices (hereinafter referred to as FETs). It performs RF or DC power supply for reliability evaluation and screening during mass production, allowing FETs to be mounted on FET mounting fixtures (hereinafter referred to as fixtures) and enabling burn-in tests under high temperatures. We propose system configurations tailored to the number of channels, FET packages, and testing conditions. 【Features】 ■ Diverse device configurations ■ Strong against oscillation ■ Stable operation possible ■ Applies specified bias voltage to the gate and drain of the FET for power supply ■ Capable of setting arbitrary testing conditions for prototype evaluation, mass production, etc., and conducting reliability tests *For more details, please refer to the product information or feel free to contact us.
- Company：多摩川電子
- Price：Other
